A single link to the first track to allow the export script to build the search page
  • Monday, May 19, 2014
  • Session 1: Yield Enhancement

    Successful Yield Ramp using Product Test, Scan and Memory Diagnosis

    • Venkatesan Muthumalai, GLOBALFOUNDRIES ;
    • David Iverson, GlobalFoundries INC ;
    • Aaron Sinnott, GlobalFoundries INC ;
    • Nancy Bell, GlobalFoundries INC ;
    • Rao Desineni, GlobalFoundries INC ;
    • Ritesh Turakhia, GlobalFoundries INC ;
    • Thomas Berndt, GlobalFoundries INC

    Tristate Inverter Array: A new test structure that compliments traditional SRAM arrays as a yield learning vehicle

    • Ishtiaq Ahsan, IBM ;
    • Carl Schiller, IBM ;
    • Zhigang Song, IBM ;
    • Robert Wong, IBM ;
    • David Clark, IBM ;
    • Felix Beaudoin, IBM ;
    • Fred Towler, IBM

    Novel Process Window and Product Yield Improvement by Eliminating Contact Shorts

    • Yuan-Chieh Chiu, Macronix International Co., Ltd., ;
    • Shih-Ping Hong, Macronix International Co., Ltd., ;
    • Fang-Hao Hsu, Macronix International Co., Ltd., ;
    • Hong-Ji Lee, Macronix International Co., Ltd., ;
    • Nan-Tzu Lian, Macronix International Co., Ltd., ;
    • Tahone Yang, Macronix International Co., Ltd., ;
    • Kuang Chao Chen, Macronix International Co., Ltd ;
    • Chih Yuan Lu, Macronix International Co., Ltd

    DiagBridge: Analyzing Scan Diagnosis Data in a Yield Perspective

    • Yan Pan, Globalfoundries Inc. ;
    • Kannan Sekar, Globalfoundries Inc. ;
    • Atul Chittora, Globalfoundries Inc. ;
    • Shobhit Malik, Globalfoundries Inc. ;
    • Seng Keat Lim, Globalfoundries Inc.

    The Importance of Reporting both Composite and Maze Yield for Process Split Yield Learning

    • Fan Zheng, IBM, East Fishkill, NY ;
    • Amanda Piper, IBM, East Fishkill, NY ;
    • Gauri Karve, IBM ;
    • Kan Zhang, IBM ;
    • Yongchun Xin, IBM, East Fishkill, NY ;
    • Jang H Sim, IBM, East Fishkill, NY ;
    • Jason J Mazzotti, IBM, East Fishkill, NY